Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleThin-film characterization with x-ray microanalysis. Extending and improving invariant embedding results.AuthorsHeluani, Silvia P.; Hoffmann, C.PublicationXRS: X-ray Spectrometry, 2003, Vol 32, Issue 2, p148ISSN0049-8246Publication typeArticleDOI10.1002/xrs.629