Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleA new approach to the determination of the Fano factor for semiconductor detectors.AuthorsPapp, T.; Lépy, M.-C.; Plagnard, J.; Kalinka, G.; Papp-Szabó, E.PublicationXRS: X-ray Spectrometry, 2005, Vol 34, Issue 2, p106ISSN0049-8246Publication typeArticleDOI10.1002/xrs.754