Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleQuantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements.AuthorsKim, Jooil; Fraser, Paul J.; Li, Shanlan; Mühle, Jens; Ganesan, Anita L.; Krummel, Paul B.; Steele, L. Paul; Park, Sunyoung; Kim, Seung-Kyu; Park, Mi-Kyung; Arnold, Tim; Harth, Christina M.; Salameh, Peter K.; Prinn, Ronald G.; Weiss, Ray F.; Kim, Kyung-RyulPublicationGeophysical Research Letters, 2014, Vol 41, Issue 13, p4787ISSN0094-8276Publication typeArticleDOI10.1002/2014GL059783