Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleNanoparticle characterization by automated acquisition and analysis of images and EDS data in the TEM.AuthorsMaddalena, Roger; Lemmens, Herman; Rikers, Yuri; Jiang, Lin; Wu, Min; Hukeri, Meghna; Wirix, MaartenPublicationMicroscopy & Microanalysis, 2021, Vol 27, p1810ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927621006620