Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleIn situ visualization of degradation of silicon field emitter tips.AuthorsNozawa, Naoyuki; Kakushima, Kuniyuki; Hashiguchi, Gen; Fujita, HiroyukiPublicationIEEJ Transactions on Electrical & Electronic Engineering, 2007, Vol 2, Issue 3, pixISSN1931-4973Publication typeArticleDOI10.1002/tee.20166