Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleElectron-beam test system for high-speed devices.AuthorsBrunner, M.; Winkler, D.; Schmitt, R.; Lischke, B.PublicationScanning, 1987, Vol 9, Issue 5, p201ISSN0161-0457Publication typeArticleDOI10.1002/sca.4950090504