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- Title
SEMATECH Reports New Approach to Simulate Transistor Noise.
- Abstract
The article reports on the transistor noise model capable of extracting defect characteristics from low-frequency noise developed by researchers from SEMATECH's Front End Processes (FEP) program. According to Michael Shur, the discoveries of the SEMATECH Inc. group is the key to understanding and minimizing noise, thus, offer extreme importance for scaling advanced device structures. It notes that the model is designed to identify and minimize defects to support aggressive device scaling.
- Subjects
NOISE control equipment; TRANSISTOR noise; SEMATECH Inc.; NOISE control products industry; TECHNOLOGY research; SHUR, Michael
- Publication
Electronic Device Failure Analysis, 2010, Vol 12, Issue 1, p43
- ISSN
1537-0755
- Publication type
Article