Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleOptical metrology embraces deep learning: keeping an open mind.AuthorsPan, BingAbstractOptical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.PublicationLight: Science & Applications, 2022, Vol 11, Issue 1, p1ISSN2047-7538Publication typeArticleDOI10.1038/s41377-022-00829-1