We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
ROBUST RELIABILITY FOR LIGHT EMITTING DIODES USING DEGRADATION MEASUREMENTS.
- Authors
Chlao, Chih-Hua; Hamada, Michael
- Abstract
Taguchi's robust design provides an important paradigm for producing robust products. There are many successful applications of this paradigm, but few have dealt with reliability, i.e. when the quality characteristic is lifetime. In this paper, an actual experiment is presented which was performed to achieve robust reliability of light emitting diodes. Three major factors chosen from many potentially important manufacturing factors and one noise factor were investigated. For light emitting diodes, failure occurs when their luminosity or light intensity fall below a specified level. An interesting feature of this experiment is the periodic monitoring of the luminosity. The paper shows how the luminosity's degradation over time provides a practical way to achieve robust reliability of light emitting diodes which are already highly reliable.
- Subjects
RELIABILITY (Personality trait); ROBUST control; LIGHT emitting diodes; LIGHT sources; DIODES; OPTICAL communications
- Publication
Quality & Reliability Engineering International, 1996, Vol 12, Issue 2, p89
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/(SICI)1099-1638(199603)12:2<89::AID-QRE997>3.0.CO;2-D