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- Title
Characterization of Ultra-Thin Films of Pd Deposited on Au(111).
- Authors
Pancotti, A.; Nascente, P.; Siervo, A.; Landers, R.; Carazzolle, M.; Tallarico, D.; Kleiman, G.
- Abstract
Ultra-thin films (1 and 3 monolayers) of Pd were deposited on the Au(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), X-ray excited Auger spectroscopy (XAES), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). For the 1 ML Pd film annealed at 450 °C, XPS and XAES results indicated that Pd had diffused into the Au substrate. For the 3 ML Pd film deposited at room temperature, the comparison between experimental and theoretical XPD results indicated approximately 30% of the surface was formed by 2 ML Au layers, and 70% of the surface, by 1 ML Au layers.
- Subjects
THIN films; PALLADIUM alloys; ALUMINUM isotopes; METALLIC surfaces; X-ray diffraction; SYNCHROTRON radiation; LOW energy electron diffraction
- Publication
Topics in Catalysis, 2011, Vol 54, Issue 1-4, p70
- ISSN
1022-5528
- Publication type
Article
- DOI
10.1007/s11244-011-9649-2