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- Title
Ultrafast Multilevel Switching in Au/YIG/n‐Si RRAM.
- Authors
Chen, Zhiwei; Huang, Weichuan; Zhao, Wenbo; Hou, Chuangming; Ma, Chao; Liu, Chuanchuan; Sun, Haoyang; Yin, Yuewei; Li, Xiaoguang
- Abstract
Resistive random access memory (RRAM) with ultrafast and multilevel switching is extremely promising for next‐generation nonvolatile memory. Here, ultrafast unipolar resistive switchings (≈540 ps) with high off/on resistance ratio (≈104) are obtained in yttrium iron garnet Y3Fe5O12 (YIG)‐based resistive memory on n‐Si substrate. The sub‐nanosecond operation is also successfully performed up to 85 °C with an off/on resistance ratio of ≈103. In addition, by using different compliance currents for the set process, five discrete resistance levels with ultrafast switchings among them are achieved and the multilevel states show reliable retention (>104 s). The large, stable, reproducible, and reliable switching behaviors of the Au/YIG/n‐Si RRAM cell shows its great potential for ultrafast multilevel memory applications. By fabricating an Au/YIG/n‐Si resistive random access memory (RRAM) on silicon, ultrafast unipolar resistive switchings (≈540 ps) with high off/on resistance ratio are demonstrated at both room temperature and 85 °C. Five discrete resistance levels with ultrafast switchings are obtained and show reliable retention. Such an ultrafast multilevel unipolar RRAM is promising for ultrafast multilevel memory applications.
- Subjects
NONVOLATILE random-access memory; SWITCHING theory; YTTRIUM iron garnet; GOLD; SILICON; ELECTRIC resistance
- Publication
Advanced Electronic Materials, 2019, Vol 5, Issue 2, pN.PAG
- ISSN
2199-160X
- Publication type
Article
- DOI
10.1002/aelm.201800418