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- Title
Rapid and adjustable shifted excitation Raman difference spectroscopy using a dual‐wavelength diode laser at 785 nm.
- Authors
Maiwald, Martin; Sumpf, Bernd; Tränkle, Günther
- Abstract
Rapid and adjustable shifted excitation Raman difference spectroscopy (SERDS) using a dual‐wavelength diode laser at 785 nm is presented. The excitation source provides 170 mW optical power and two laser lines with a flexible spectral distance up to 36 cm−1. Raman and SERDS experiments with integration times down to 50 ms are performed using Irish cream as the test sample. The results demonstrate rapid and adjustable SERDS as a potential tool for real‐time Raman applications with strong background interferences.
- Subjects
RAMAN spectroscopy; SEMICONDUCTOR lasers; WAVELENGTHS; DISTRIBUTED Bragg reflectors; FLUORESCENCE
- Publication
Journal of Raman Spectroscopy, 2018, Vol 49, Issue 11, p1765
- ISSN
0377-0486
- Publication type
Article
- DOI
10.1002/jrs.5456