Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleApplication of X-ray emission spectrometry (LEEIXS) to the study of insulator surface-molecular characterization of some metallic oxides or compounds.AuthorsGaillard, F.; Romand, M.PublicationSurface & Interface Analysis: SIA, 1990, Vol 16, Issue 1-12, p429ISSN0142-2421Publication typeArticleDOI10.1002/sia.740160189