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- Title
Muon capture probability of carbon and oxygen for CO, CO, and COS under low-pressure gas conditions.
- Authors
Yoshida, G.; Ninomiya, K.; Ito, T.; Higemoto, W.; Nagatomo, T.; Strasser, P.; Kawamura, N.; Shimomura, K.; Miyake, Y.; Miura, T.; Kubo, K.; Shinohara, A.
- Abstract
When a negatively charged muon is stopped in a substance, it is captured by an atom of the substance, and the muonic atom is formed. The muon capture process is significantly affected by the chemical environment of the atom and factors such as molecular structure (chemical effect). In this study, we performed muon irradiation for low-pressure CO, CO, and COS molecules and measured the muonic X-rays emitted immediately after muon capture by an atom. In this paper, we quantitatively discuss the muon capture probability of each type of atom using the LMM model.
- Subjects
MUONS; LOW pressure (Science); PRESSURE; ION traps; CARBON sequestration
- Publication
Journal of Radioanalytical & Nuclear Chemistry, 2015, Vol 303, Issue 2, p1277
- ISSN
0236-5731
- Publication type
Article
- DOI
10.1007/s10967-014-3602-3