Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleLeveraging First Principles Modeling and Machine Learning for Microscopy Data Inversion.AuthorsSchwenker, Eric; Sen, Fatih; Hills, Spencer; Pualauskas, Tadas; Ce Sun; Liang Li; Kinaci, Alper; Letchworth-Weaver, Kendra; Kim, Moon; Klie, Robert; Jianguo Wen; Chan, Maria K. Y.PublicationMicroscopy & Microanalysis, 2017, Vol 23, p178ISSN1431-9276Publication typeArticleDOI10.1017/S143192761700157X