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- Title
Influence of cationic stoichiometry of the bottom electrode La[sub 1-x] Sr[sub x] CoO[sub 3] on the microstructures of Pb(Ta[sub 0.05] Zr[sub 0.48] Ti[sub 0.47] )O[sub 3] ferroelectric films using Pt/TiO[sub 2] conducting barrier.
- Authors
Yin, J.; Li, Q.L.; Liu, Z.G.; Wang, M.; Wu, Z.C.; Yu, T.
- Abstract
Abstract. The heterostructures La[sub 1-x]Sr[sub x]CoO[sub 3]/Pb(Ta[sub 0.05] Zr[sub 0.48]Ti[sub 0.47])O[sub 3](PTZT)/La[sub 1-x] Sr[sub x]CoO[sub 3] have been deposited on SiO[sub 2]/Si(001) substrates using Pt/TiO[sub 2] as conductive barrier by pulsed-laser deposition. La[sub 0.25]Sr[sub 0.75]CoO[sub 3](25/75) bottom electrodes with a pseudo-cubic perovskite structure favors (001)-textured growth of PTZT films. The ferroelectric capacitor LSCO(25/75)/PTZT/LSCO(25/75) remains about 96% of its polarization after 5 x 10[sup 10] switching cycles at an applied voltage of 5 V and a frequency of 500 kHz. The cross-section morphology of scanning electron microscopy and Rutherford backscattering spectra show that no obvious interdiffusion occurs across the interfaces.
- Subjects
FERROELECTRIC thin films; ELECTRODES; HETEROSTRUCTURES
- Publication
Applied Physics A: Materials Science & Processing, 2000, Vol 70, Issue 1, p69
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s003390050013