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- Title
SM<sup>3+</sup>-Activated LiZnPO<sub>4</sub> Phosphors: Synthesis, Characterization, and Their Luminescent Properties for White Light-Emitting Diode Applications.
- Authors
Rafiq, Haqnawaz; Farooq, Mudasir; Rubab, Seemin; Rasool, Mir Hashim
- Abstract
This work presents a comprehensive analysis of the synthesis, structural–spectroscopic characterization, thermal stability, and luminescent attributes of Sm3+-activated LiZnPO4 phosphors with diverse Sm3+ doping percentiles that work towards developing luminescent materials for white-light-emitting diode (WLED) applications. The polycrystalline samples of LiZn(1 − x) Smx3+PO4 (x = 0, 0.01, 0.03, 0.05, 0.07, 0.09, and 0.10) phosphor were synthesized using a solid-state reaction (SSR) technique. X-ray diffraction (XRD) and Rietveld refinement indicate a single-phase monoclinic structure of all compositions with the C1c1 space group. Phase purity and stoichiometry of elemental composition were validated by Fourier transform infrared (FTIR) spectroscopy and energy-dispersive spectroscopy (EDS) examination. Field-emission scanning electron microscopy (FE-SEM) images indicate irregular and nonuniform microstructures for all compositions with a mean dimension of 1.252 µm. The investigation of diffuse reflectance (DR) spectra with the Kubelka–Munk function F(R∞) determines the compound's bandgap to be 3.1 eV. Time-of-flight secondary ion mass spectroscopy (ToF-SIMS) indicates various ions are regularly distributed across the surface. Further, the photometric analysis reveals that the Commission Internationale de l'Éclairage (CIE) coordinates are roughly (0.55, 0.44), and color purity is greater than 82% in all compositions. These results, along with the photoluminescence (PL) spectral analysis, lifetime analysis, and thermal stability, indicate that Sm3+-doped LiZnPO4 is a viable orange-red-emitting phosphor candidate for creating white-light-emitting diodes (WLEDs).
- Subjects
LIGHT emitting diodes; PHOSPHORS; RIETVELD refinement; MASS spectrometry; SCANNING electron microscopy; X-ray diffraction; SECONDARY ion mass spectrometry
- Publication
Journal of Electronic Materials, 2024, Vol 53, Issue 6, p2929
- ISSN
0361-5235
- Publication type
Article
- DOI
10.1007/s11664-024-11061-5