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- Title
Editorial.
- Authors
Agrawal, Vishwani
- Abstract
The author discusses issues related to defect and fault tolerance (DFT). Factors that have started affecting proper function as device sizes shrink to nanometer dimensions are cited, including single event upsets (SEU). Information on DFT 2013 or the 15th Institute of Electrical and Electronics Engineers (IEEE) Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems to be held in New York in October is also provided.
- Subjects
FAULT tolerance (Engineering); NANOELECTROMECHANICAL systems; SINGLE event effects; NANOTECHNOLOGY conferences; VERY large scale circuit integration; CONFERENCES &; conventions
- Publication
Journal of Electronic Testing, 2013, Vol 29, Issue 3, p255
- ISSN
0923-8174
- Publication type
Editorial
- DOI
10.1007/s10836-013-5391-y