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- Title
Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural Paintings.
- Authors
Nicolopoulos, Stavros; Das, Partha P.; Pérez, Alejandro Gómez; Zacharias, Nikolaos; Cuapa, Samuel Tehuacanero; Alatorre, Jesús Angel Arenas; Mugnaioli, Enrico; Gemmi, Mauro; Rauch, Edgar F.
- Abstract
To understand in-depth material properties, manufacturing, and conservation in cultural heritage artefacts, there is a strong need for advanced characterization tools that enable analysis down to the nanometric scale. Transmission electron microscopy (TEM) and electron diffraction (ED) techniques, like 3D precession electron diffraction tomography and ASTAR phase/orientation mapping, are proposed to study cultural heritage materials at nanoscale. In this work, we show how electron crystallography in TEM helps to determine precise structural information and phase/orientation distribution of various pigments in cultural heritage materials from various historical periods like Greek amphorisks, Roman glass tesserae, and pre-Hispanic Maya mural paintings. Such TEM-based methods can be an alternative to synchrotron techniques and can allow distinguishing accurately different crystalline phases even in cases of identical or very close chemical compositions at the nanometric scale.
- Subjects
ELECTRON diffraction; TRANSMISSION electron microscopy; ELECTRON microscope techniques; CULTURAL property; MAYAS; NANOSTRUCTURED materials
- Publication
Scanning, 2019, p1
- ISSN
0161-0457
- Publication type
Article
- DOI
10.1155/2019/4870695