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- Title
Advanced analysis of copper X-ray photoelectron spectra.
- Authors
Biesinger, Mark C.
- Abstract
Chemical state X-ray photoelectron spectroscopic analysis of copper species is challenging because of the complexity of the 2p spectra resulting from shake-up structures for Cu(II) species and overlapping binding energies for Cu metal and Cu(I) species. This paper builds upon and extends previously published X-ray photoelectron spectroscopy curve-fitting and data analysis procedures for a wide range of copper containing species. Steps undertaken include the following: (i) an examination of existing Cu 2p3/2 main peak and Cu 2p3/2 - Cu L3M4,5M4,5 Auger parameter literature data, (ii) analysis of a series of quality standard samples, (iii) curve-fitting procedures for both the Cu 2p3/2 and the Cu L3M4,5M4,5 spectra (as well as associated anions), (iv) calculations that determine the amount of Cu(II) species in a mixed oxidation state system, (v) calculations and necessary data for thin film mixed oxide/hydroxide thickness measurements, and (vi) a presentation of literature and standard sample values in a Wagner (chemical state) plot.
- Subjects
COPPER spectra; X-ray photoelectron spectra; CHEMICAL structure; AUGER effect; REGULAR graphs
- Publication
Surface & Interface Analysis: SIA, 2017, Vol 49, Issue 13, p1325
- ISSN
0142-2421
- Publication type
Article
- DOI
10.1002/sia.6239