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- Title
Microsystems Application Technology Center Launched.
- Abstract
The article reports on the launching of the Microsystems Application Technology Center (MATC) at Lorain County Community College (LCCC) in Elyria, Ohio. Accordingly, the MATC will provide forensic capabilities and simulation tools to allow the study of microsystem device reliability and life in harsh environments. Moreover, the project will be made possible the effort of ASM International by partnering with the Ohio Micro-Electro-Mechanical System (MEMS) Association and LCCC's Entrepreneurial Innovation Center (EIC).
- Subjects
ELYRIA (Ohio); OHIO; RELIABILITY in engineering; MICROELECTROMECHANICAL systems; BUSINESS partnerships; TECHNOLOGICAL innovations; ENGINEERING systems; ASM International; LORAIN County Community College (Elyria, Ohio)
- Publication
Electronic Device Failure Analysis, 2008, Vol 10, Issue 3, p41
- ISSN
1537-0755
- Publication type
Article