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- Title
ForMAX - a beamline for multiscale and multimodal structural characterization of hierarchical materials.
- Authors
Nygård, K.; McDonald, S. A.; González, J. B.; Haghighat, V.; Appel, C.; Larsson, E.; Ghanbari, R.; Viljanen, M.; Silva, J.; Malki, S.; Li, Y.; Silva, V.; Weninger, C.; Engelmann, F.; Jeppsson, T.; Felcsuti, G.; Rosén, T.; Gordeyeva, K.; Söderberg, L. D.; Dierks, H.
- Abstract
The article discusses the ForMAX beamline at the MAX IV Laboratory, which is designed for the multiscale and multimodal structural characterization of hierarchical materials. The beamline combines small- and wide-angle X-ray scattering with full-field X-ray microtomography to provide detailed structural information. It is particularly focused on the development of fibrous materials from forest resources but can also be used for research in food science and biomedical fields. The article outlines the technical design of the beamline and provides examples of the structural characterization available. The text also mentions the different setups and modes of operation for different experiments. The beamline offers various techniques for structural characterization of materials, including small-angle X-ray scattering (SAXS), wide-angle X-ray scattering (WAXS), and synchrotron radiation-based X-ray computed tomography (SRmCT). The beamline provides fast data reduction using Python and MatFRAIA, and calibration and masking of detectors using PyFAI. It also offers live plotting of reduced SWAXS data for monitoring experiments. The beamline's beam size, flux, and coherence properties are also discussed. Overall, ForMAX provides a versatile platform for studying hierarchical materials at different length scales. The article discusses the capabilities and potential applications of the ForMAX beamline at the MAX IV Laboratory. The beamline allows for multiscale and multimodal structural characterization of hierarchical materials in the nanometer to millimeter range. It combines small-angle X-ray scattering (SAXS), scanning SAX
- Subjects
SMALL-angle X-ray scattering; X-ray scattering; MATERIALS science; SYNCHROTRON radiation; UNDULATOR radiation; MOTION detectors; THRESHOLD energy
- Publication
Journal of Synchrotron Radiation, 2024, Vol 31, Issue 2, p363
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577524001048