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- Title
EFFECT OF AGING ON FRACTURE LOAD AND RELIABILITY OF CEMENTED GLASS-CERAMICS.
- Authors
Simião da Rocha, Larissa; Borba, Márcia; Ottoni, Rodrigo; Picolo Furini, Giordana; Della Bona, Alvaro; Benetti, Paula
- Abstract
Purpose: To evaluate the influence of aging on the fracture load (Lf) and reliability of glass- ceramics a;er different etching protocols. Materials and Methods: Specimens were fabricated and divided according to the etching Ame (10% hydrofluoric acid [HF] for 20 seconds, 40 seconds, and 60 seconds). Etched surfaces were examined under microscopy. The ceramics were resin-cemented to a denAn analog material. Samples were split into two groups (n = 20 each) and tested a;er 24 hours (I) or stored in 37°C water for 1 year (A). A compressive load (0.1 mm/minute) was applied to the samples unAl failure was detected by acoustic emission. The influence of aging on the Lf was tested by two-way ANOVA and Tukey tests (α = .05). The characterisAc fracture load (L0) and Weibull modulus (m) values were calculated. Results: Lithium silicate (LS) etching for 20 seconds resulted in the highest immediate Lf, which was significantly decreased a;er aging (P ≤ .05). Water storage had no effect on the Lf of glass- ceramic etched for 40 and 60 seconds (P > .05). For lithium disilicate (LD), the etching Ame had no significant effect on the immediate or aged Lf (P > .05). The Lf was significantly reduced a;er aging (A) for LD (P ≤ .05). Radial cracks were the predominant failure mode. Surface topography was more regular a;er lower etching Ames for LD and a;er higher Ames for LS. Conclusions: After 1 year of water-assisted aging, the evaluated etching Ames had no influence on the load-bearing capacity and structural reliability of resin-bonded glass- ceramics.
- Subjects
AMES (Iowa); GLASS-ceramics; STRUCTURAL reliability; ACOUSTIC emission; COMPRESSION loads; SURFACE topography
- Publication
International Journal of Prosthodontics, 2024, Vol 37, Issue 2, pe81
- ISSN
0893-2174
- Publication type
Article
- DOI
10.11607/ijp.8104