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- Title
Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B 4 C Multilayers.
- Authors
Chang, Chenyuan; Wei, Zhenbo; Jiang, Hui; Ni, Hangjian; Song, Wentao; He, Jialian; Xiang, Simeng; Wang, Zhanshan; Zhang, Zhe; Zhang, Zhong
- Abstract
The functionality and reliability of nanoscale multilayer devices and components are influenced by changes in stress and microstructure throughout fabrication, processing, and operation. NiV/B4C multilayers with a d-spacing of 3 nm were prepared by magnetron sputtering, and two groups of annealing experiments were performed. The stress, microstructure, and interface changes in NiV/B4C after annealing were investigated by grazing-incidence X-ray reflectometry (GIXR), grazing-incidence X-ray diffraction (GIXRD), X-ray diffuse scattering, and grazing-incidence small-angle X-ray scattering (GISAXS). The temperature dependence experiments revealed a gradual shift in the multilayer stress from compression to tension during annealing from 70 °C to 340 °C, with the stress approaching near-zero levels between 70 °C and 140 °C. The time-dependent experiments indicated that most of the stress changes occurred within the initial 10 min, which showed that prolonged annealing was unnecessary. Combining the X-ray diffraction and X-ray scattering measurements, it was found that the changes in the thickness, interface roughness, and lateral correlation length, primarily due to crystallization, drove the changes in stress and microstructure.
- Subjects
SMALL-angle X-ray scattering; MULTILAYERS; INTERFACIAL roughness; X-ray reflectometry; MICROSTRUCTURE; SURFACE tension; MULTILAYERED thin films
- Publication
Coatings (2079-6412), 2024, Vol 14, Issue 4, p513
- ISSN
2079-6412
- Publication type
Article
- DOI
10.3390/coatings14040513