Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleImprovement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors.AuthorsKarydas, A. G.; Zarkadas, Ch.; Kyriakis, A.; Pantazis, J.; Huber, A.; Redus, R.; Potiriadis, C.; Paradellis, T.PublicationXRS: X-ray Spectrometry, 2003, Vol 32, Issue 2, p93ISSN0049-8246Publication typeArticleDOI10.1002/xrs.621