Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleA semi-empirical method for quantitative XRF analysis of thick samples.AuthorsGovil, R.; Kataria, S. K.PublicationXRS: X-ray Spectrometry, 1982, Vol 11, Issue 3, p144ISSN0049-8246Publication typeArticleDOI10.1002/xrs.1300110311