We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
透過電子顕微鏡における スピン偏極パルス電子線を用いた時間分解計測.
- Authors
桑 原 真 人
- Abstract
Time-resolved measurements in transmission electron microscopy (TEM) offer the possibility of revealing ultrafast phenomenon with nanometer spatial resolution, allowing the analysis of nonuniform materials, functional materials, and advanced nano-devices. A high-quality pulsed electron beam, with high brightness, narrow energy width, and high spinpolarization, was realized by installing a semiconductor-type photocathode having a negative electron affinity surface to an electron gun in the TEM system. We conducted time-resolved measurements of electron energy-loss spectrum with picosecond pulsed electron beam in the TEM, and elucidated electron-phonon and phonon-phonon relaxation processes in photo-excited gold nanoparticles. Furthermore, the intensity interference of charged fermions was realized by temporally modulated spin-polarized electrons. The coherent spin-polarized electron beam facilitates the extraction of intrinsic quantum interference. These application results pave the way for a new analytical method for the ultrafast dynamics of electrons and lattices in materials, in addition to quantum measurements in electron microscopes.
- Publication
Vacuum & Surface Science, 2023, Vol 66, Issue 12, p711
- ISSN
2433-5835
- Publication type
Article
- DOI
10.1380/vss.66.711