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- Title
Chemical composition mapping with nanometre resolution by soft X-ray microscopy.
- Authors
Shapiro, David A.; Yu, Young-Sang; Tyliszczak, Tolek; Cabana, Jordi; Celestre, Rich; Chao, Weilun; Kaznatcheev, Konstantin; Kilcoyne, A. L. David; Maia, Filipe; Marchesini, Stefano; Meng, Y. Shirley; Warwick, Tony; Yang, Lee Lisheng; Padmore, Howard A.
- Abstract
X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the X-ray optics. Here, using soft X-ray ptychography, we demonstrate the highest-resolution X-ray microscopy ever achieved by imaging 5 nm structures. We quantify the performance of our microscope and apply the method to the study of delithiation in a nanoplate of LiFePO4, a material of broad interest in electrochemical energy storage. We calculate chemical component distributions using the full complex refractive index and demonstrate enhanced contrast, which elucidates a strong correlation between structural defects and chemical phase propagation. The ability to visualize the coupling of the kinetics of a phase transformation with the mechanical consequences is critical to designing materials with ultimate durability.
- Subjects
X-ray microscopy; X-ray diffraction; REFRACTIVE index; PHASE transitions; PHOTONICS
- Publication
Nature Photonics, 2014, Vol 8, Issue 10, p765
- ISSN
1749-4885
- Publication type
Article
- DOI
10.1038/nphoton.2014.207