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- Title
Editorial.
- Authors
Agrawal, Vishwani D.
- Abstract
This document is an editorial from the Journal of Electronic Testing. It provides an overview of the articles featured in the issue, which cover various topics related to electronic testing. These topics include machine intelligence applications, single event upset phenomenon, verification, graphics processing unit (GPU), software testing, memory testing, hardware security, and 3-dimensional-stacked device testing. The editorial also mentions that three of the articles were developed from presentations at the IEEE 24th Latin American Test Symposium. The document concludes with a note from the publisher stating their neutrality on jurisdictional claims and institutional affiliations.
- Subjects
COMPUTER software testing; SINGLE event effects; VOLTAGE-controlled oscillators; PHASE-locked loops
- Publication
Journal of Electronic Testing, 2024, Vol 40, Issue 2, p137
- ISSN
0923-8174
- Publication type
Article
- DOI
10.1007/s10836-024-06120-y