Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleIn situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films.AuthorsSpousta, J.; Urbánek, M.; Chmelík, R.; Jiruše, J.; Zlámal, J.; Navrátil, K.; Nebojsa, A.; Šikola, T.PublicationSurface & Interface Analysis: SIA, 2002, Vol 34, Issue 1, p664ISSN0142-2421Publication typeArticleDOI10.1002/sia.1383