Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleAdvanced Analytical Capabilities on FIB Instruments Using SIMS.AuthorsWirtz, Tom; Castro, Olivier De; Biesemeier, Antje; Hoang, Hung Quang; Audinot, Jean-NicolasPublicationMicroscopy & Microanalysis, 2020, Vol 26, Issue S2, p82ISSN1431-9276Publication typeAbstractDOI10.1017/S143192762001332X