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- Title
X-ray Topographic Identification and Measurement of Plastic Strains and Elastic Stresses in Single Crystallites of Polycrystalline Diamond Layers.
- Authors
Kuznetsov, G. F.
- Abstract
The well-known phenomenon of asterism is used as the basis for the development of an X-ray topographic method to identify and measure plastic strains and residual elastic stresses in single crystallites more than 3μm in size in polycrystalline diamond layers. The amount of asterism is used as a quantitative measure of plastic strains in crystallites. The distribution of crystallites over the amount of asterism in 40- to 670-μm-thick microwave-plasma-deposited polycrystalline diamond layers is obtained. Shear plastic strains, which cause a misorientation from 0.4′ to 1.5° between different areas of a crystallite, are observed for the first time. The residual elastic stresses calculated in plastically strained crystallites vary between 2.7 kPa and 0.84 GPa. © 2003 MAIK “Nauka / Interperiodica”.
- Subjects
ASTERISM (Crystallography); QUANTUM electronics; POLYCRYSTALS; STRAINS &; stresses (Mechanics); OPTICS
- Publication
Technical Physics, 2003, Vol 48, Issue 12, p1546
- ISSN
1063-7842
- Publication type
Article
- DOI
10.1134/1.1634675