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- Title
X-ray microscope captures images of subsurface levels.
- Abstract
The article reports that CSIRO Manufacturing & Infrastructure Technology of Australia have developed an X-ray microscope that can directly image the internal microstructures of even opaque and multi-layer objects. This X-ray ultramicroscope can deliver submicron resolution of the internal structures of opaque and multi-layer objects down to 50 nanometer, while phase-contrast imaging with commercial X-ray microfocus sources enables improved contrast with resolution down to about a micron.
- Subjects
MICROSCOPES; OPTICAL instruments; X-ray microscopy; CSIRO Materials Science &; Engineering (Company); INSTRUMENT industry
- Publication
Advanced Materials & Processes, 2006, Vol 164, Issue 12, p10
- ISSN
0882-7958
- Publication type
Article