Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDetecting The Fault Location Using Traveling Wave.AuthorsBărburaş, Ioan Vasile; Petrovan, Tudor Mihai; Năsui, Ichim; Bugnar, Stelian; Zah, Ioana Năsui; Boiciuc, IoanSubjectsTRAVELING waves (Physics); ELECTROMECHANICAL devices; WAVE mechanics; MICROPROCESSORS; ELECTRIC potentialPublicationActa Electrotehnica, 2015, Vol 56, Issue 3, p23ISSN1841-3323Publication typeArticle