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- Title
A Design of Linearity Built-in Self-Test for Current-Steering DAC.
- Authors
Hsin-Wen Ting; Soon-Jyh Chang; Su-Ling Huang
- Abstract
In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.
- Subjects
DIGITAL-to-analog converters; NONLINEAR electric circuits; HARMONIC oscillators; DIGITAL electronics; ELECTRONIC circuits testing
- Publication
Journal of Electronic Testing, 2011, Vol 27, Issue 1, p85
- ISSN
0923-8174
- Publication type
Article
- DOI
10.1007/s10836-010-5187-2