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- Title
Sources of resistance to Bipolaris maydis in popcorn lines under field conditions.
- Authors
Saluci, Julio Cesar Gradice; Vivas, Marcelo; Dutra, Íris Petronilia; De Almeida, Rafael Nunes; Santos, Juliana Saltires; Junior, Antônio Teixeira Do Amaral; Pelúzio, João Batista Esteves
- Abstract
Southern corn leaf blight (SCLB), caused by the pathogen Bipolaris maydis, can cause significant damage to popcorn production. However, genetic resistance in maize germplasm offers a viable strategy for disease control. This work investigated the performance of popcorn lines for SCLB resistance and their potential for producing hybrids. Thirty-five lines were evaluated in two environments using a randomized block design with four replicates. Measurements of Bipolaris incidence (BI) and severity (BS) were taken 30 days after the beginning of flowering. Grain yield (GY) and popping expansion (PE) were evaluated at grain maturity. The data were analyzed using joint analysis of variance and the Scott-Knott test at a 5% significance level. Significant variation in all four parameters were observed for BI, BS, GY and PE, and the lines were grouped accordingly. Two lines with high levels of resistance to SCLB (L623 and L624) were identified. Five lines (L509, L204, L683, L292, L70) stand out as having high potential for breeding based on their levels of both popping expansion and SCLB resistance.
- Subjects
BIPOLARIS; POPCORN; GRAIN yields; STATISTICAL hypothesis testing; ANALYSIS of variance; JOB performance; CORN diseases; CORN disease &; pest control
- Publication
European Journal of Plant Pathology, 2023, Vol 165, Issue 3, p545
- ISSN
0929-1873
- Publication type
Article
- DOI
10.1007/s10658-022-02626-3