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Effects of Methane Concentration in the Deposition Process on the Crystal Structure and the Adhesive Fracture Toughness of CVD Diamond.
- Published in:
- Journal of the American Ceramic Society, 2002, v. 85, n. 1, p. 179, doi. 10.1111/j.1151-2916.2002.tb00063.x
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- Article
Convergent-beam electron diffraction.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. suppl_1, p. S245
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- Publication type:
- Article
Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 129, doi. 10.1093/jmicro/dfl020
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- Article
Lattice parameter determination of a composition controlled Si1−x Gex layer on a Si (001) substrate using convergent-beam electron diffraction.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 593, doi. 10.1093/jmicro/dfh091
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- Article
Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED.
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- Journal of Electron Microscopy, 2004, v. 53, n. 1, p. 11, doi. 10.1093/jmicro/53.1.11
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- Article
Simulations of Kikuchi patterns due to thermal diffuse scattering on MgO crystals.
- Published in:
- Journal of Electron Microscopy, 2002, v. 51, n. 3, p. 205, doi. 10.1093/jmicro/51.3.205
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- Article
Simulations of Kikuchi patterns due to thermal diffuse scattering on MgO crystals.
- Published in:
- Journal of Electron Microscopy, 2002, v. 51, n. 1, p. 67, doi. 10.1093/jmicro/51.1.67
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- Publication type:
- Article
JEM's Hopes in the Twenty‐first Century.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 1, p. 1, doi. 10.1093/jmicro/50.1.1
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- Publication type:
- Article
Interferometry by Coherent Convergent-Beam Electron Diffraction.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 59, doi. 10.1093/oxfordjournals.jmicro.a023413
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- Article
crystallographers.
- Published in:
- 2000
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- Publication type:
- Obituary