Found: 27
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Monte Carlo Modeling of Ion Beam Induced Secondary Electrons.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 302, doi. 10.1017/S1431927614003237
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- Article
Oliver Wells (1931-2013) A Brief Memorial.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2, doi. 10.1017/S1431927614001731
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- Article
The Introduction and Application of a Selective Directional Capability of the Image Contrast Transfer Function in the ImageJ “SMARTeR” Package.
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- 2010
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- Abstract
A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging.
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- 2010
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- Abstract
Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM.
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- 2010
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- Abstract
Nano-tip Electron Gun for the Scanning Electron Microscope.
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- Microscopy & Microanalysis, 2005, v. 11, p. 766, doi. 10.1017/S1431927605507682
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- Article
Absolute Calibration of Auger Spectrometer for Measuring SE and BSE Yield.
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- Microscopy & Microanalysis, 2005, v. 11, p. 768, doi. 10.1017/S1431927605500886
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- Article
The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector.
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- Microscopy & Microanalysis, 2004, v. 10, n. S03, p. 58, doi. 10.1017/S1431927604555757
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- Article
The Aberration-corrected SEM - the Ultimate Accessory?
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- Microscopy & Microanalysis, 2004, v. 10, n. S02, p. 952, doi. 10.1017/S1431927604880930
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- Article
Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines.
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- Scanning, 2003, v. 25, n. 4, p. 210, doi. 10.1002/sca.4950250408
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- Article
Experimental resolution measurement in critical dimension scanning electron microscope metrology.
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- Scanning, 2003, v. 25, n. 4, p. 175, doi. 10.1002/sca.4950250403
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- Article
Microanalysis using secondary electrons in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 295, doi. 10.1002/sca.4950230501
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- Article
A study of electron beam-induced conductivity in resists.
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- Scanning, 1999, v. 21, n. 4, p. 264, doi. 10.1002/sca.4950210406
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- Article
Secondary electron imaging in the variable pressure scanning electron microscope.
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- Scanning, 1998, v. 20, n. 6, p. 436, doi. 10.1002/sca.1998.4950200603
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- Article
A monte carlo study of the position of phase boundaries in backscattered electron images.
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- Scanning, 1997, v. 19, n. 8, p. 547, doi. 10.1002/sca.4950190804
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- Article
Low-energy electron/atom elastic scattering cross sections from 0.1-30 keV.
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- Scanning, 1995, v. 17, n. 4, p. 250, doi. 10.1002/sca.4950170406
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- Article
Calculation of secondary electron production using a diffusion matrix.
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- Scanning, 1991, v. 13, n. 3, p. 227, doi. 10.1002/sca.4950130304
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- Article
Monte Carlo simulation of CL and EBIC contrasts for isolated dislocations.
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- Scanning, 1990, v. 12, n. 1, p. 5, doi. 10.1002/sca.4950120103
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- Article
An empirical stopping power relationship for low-energy electrons.
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- Scanning, 1989, v. 11, n. 4, p. 176, doi. 10.1002/sca.4950110404
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- Article
Control of charging in low-voltage SEM.
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- Scanning, 1989, v. 11, n. 1, p. 1, doi. 10.1002/sca.4950110102
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- Article
Measurements of electron channeling pattern linewidths in silicon.
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- Scanning, 1979, v. 2, n. 4, p. 249, doi. 10.1002/sca.4950020407
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- Article
Diverse and conserved nano- and mesoscale structures of diatom silica revealed by atomic force microscopy.
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- Journal of Microscopy, 2009, v. 235, n. 2, p. 172, doi. 10.1111/j.1365-2818.2009.03198.x
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- Article
Scanning electron microscope imaging in liquids – some data on electron interactions in water.
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- Journal of Microscopy, 2006, v. 221, n. 2, p. 84, doi. 10.1111/j.1365-2818.2006.01548.x
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- Article
SMART – a program to measure SEM resolution and imaging performance.
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- Journal of Microscopy, 2002, v. 208, n. 1, p. 24, doi. 10.1046/j.1365-2818.2002.01062.x
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- Article
Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model.
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- Scientific Reports, 2018, v. 8, n. 1, p. 1, doi. 10.1038/s41598-018-31231-w
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- Article
Determination of UTW k<sub>XSi</sub> factors for seven elements from oxygen to iron.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 219, doi. 10.1111/j.1365-2818.1984.tb00530.x
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- Article
THE ROLE OF FAST SECONDARY ELECTRONS IN DEGRADING SPATIAL RESOLUTION IN THE ANALYTICAL ELECTRON MICROSCOPE.
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- Journal of Microscopy, 1982, v. 128, n. 2, p. RP1, doi. 10.1111/j.1365-2818.1982.tb00442.x
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- Article