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- Title
ELECTRICAL STUDY OF THIN FILM Al/n-CdS SCHOTTKY JUNCTION.
- Authors
Gupta, Sandhya; Patidar, Dinesh; Saxena, N. S.; Sharma, Kananbala
- Abstract
A study has been made on the behaviour of Al/n-CdS thin film junction on Polyethylene terephthalate (PET) grown using thermal evaporation method. I-V characteristics of this junction show that the Al makes Schottky contact with n-CdS. Intrinsic and contact properties such as saturation current, barrier height, ideality factor and series resistance were calculated from the I-V characteristics. The conduction seems to be predominantly due to thermoionic emission-diffusion mechanism. An effort has also been made to carry Optical study of CdS thin film was also carried out using spectrophotometer. Band gap of n-CdS thin film is determined through absorption spectra using the Tauc's extrapolation. A band diagram of Al/n-CdS has been proposed using the so obtained data.
- Subjects
THIN films; POLYETHYLENE terephthalate; METAL semiconductor field-effect transistors; SPECTROPHOTOMETERS; CADMIUM sulfide; OPTOELECTRONIC devices; ELECTROMETERS; X-ray diffraction; ELECTRONS
- Publication
Chalcogenide Letters, 2009, Vol 6, Issue 12, p723
- ISSN
1841-4834
- Publication type
Article