Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleISTFA 2014 Preview.AuthorsBodoh, DanAbstractThe article offers information related to the 40th International Symposium for Testing and Failure Analysis (ISTFA) to be sponsored by the Electronic Device Failure Analysis Society (EDFAS) on November 9-13, 2014, in Houston, Texas.SubjectsHOUSTON (Tex.); FAILURE analysis; SEMICONDUCTOR failures; CONFERENCES &; conventionsPublicationElectronic Device Failure Analysis, 2014, Vol 16, Issue 3, p34ISSN1537-0755Publication typeProceeding