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- Title
High-resolution microscopy techniques for the analysis of structural inhomogeneities on the surface of organic films.
- Authors
Rozanov, V. V.; Evstrapov, A. A.
- Abstract
Features of the analysis of the surface structure of a polyimide Langmuir-Blodgett film by means of high-resolution atomic force microscopy and confocal laser scanning microscopy are considered. It is suggested that the appearance of structural inhomogeneities on the micron and submicron levels is related to the presence of mechanical defects in substrates and to the process of thermal imidization.
- Subjects
MULTILAYERED thin films; POLYIMIDES; ATOMIC force microscopy; SCANNING probe microscopy; SURFACES (Physics)
- Publication
Technical Physics Letters, 2008, Vol 34, Issue 8, p653
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/S1063785008080087