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- Title
At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals.
- Authors
Xianbo Shi; Zhi Qiao; Pradhan, Paresh; Peifan Liu; Assoufid, Lahsen; Kwang-Je Kim; Yuri Shvyd'ko
- Abstract
The advent of next-generation synchrotron radiation sources and X-ray freeelectron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray freeelectron lasers.
- Subjects
CRYSTAL optics; DIAMOND crystals; SYNCHROTRON radiation sources; SILICON crystals; CRYSTALS
- Publication
Journal of Synchrotron Radiation, 2023, Vol 30, Issue 6, p1100
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577523007531