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- Title
Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity.
- Authors
Márquez, Emilio; Blanco, Eduardo; Mánuel, José M.; Ballester, Manuel; García-Gurrea, Marcos; Rodríguez-Tapiador, María I.; Fernández, Susana M.; Willomitzer, Florian; Katsaggelos, Aggelos K.
- Abstract
Copper-nitride (Cu 3 N) semiconductor material is attracting much attention as a potential, next-generation thin-film solar light absorber in solar cells. In this communication, polycrystalline covalent Cu 3 N thin films were prepared using reactive-RF-magnetron-sputtering deposition, at room temperature, onto glass and silicon substrates. The very-broadband optical properties of the Cu 3 N thin film layers were studied by UV-MIR (0.2–40 μ m) ellipsometry and optical transmission, to be able to achieve the goal of a low-cost absorber material to replace the conventional silicon. The reactive-RF-sputtered Cu 3 N films were also investigated by focused ion beam scanning electron microscopy and both FTIR and Raman spectroscopies. The less dense layer was found to have a value of the static refractive index of 2.304, and the denser film had a value of 2.496. The iso-absorption gap, E 04 , varied between approximately 1.3 and 1.8 eV and could be considered suitable as a solar light absorber.
- Subjects
ELLIPSOMETRY; FOCUSED ion beams; THIN films; COPPER; OPTICAL properties; REFRACTIVE index
- Publication
Coatings (2079-6412), 2024, Vol 14, Issue 1, p5
- ISSN
2079-6412
- Publication type
Article
- DOI
10.3390/coatings14010005