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- Title
Effect of the deposition technological parameters on the transparences distribution functions of Josephson junction barriers.
- Authors
Shaternik, A.; Shapovalov, A.; Prikhna, T.
- Abstract
Charge transport in superconductor-insulator-superconductor junctions has been studied. To relate technological parameters of the deposition of junction layers and barrier's structure to model parameters of charge transport in these junctions for the first time has been made possible by the use of superhard material, leucosapphire, as the substrates to produce Josephson junction. The results have been considered of experimental studies of nanosized structures fabricated on the basis of thin films of MoRe superconductors. The charge transport in these heterostructures has been analyzed in the framework of the modified theoretical model of multiple Andreev reflections taking into account the function of the barrier transparencies distribution. Such approach allows one to describe the evolution of the shape of the real current-voltage characteristics of heterostructures depending on technological conditions of manufacturing the heterostructures.
- Publication
Journal of Superhard Materials, 2014, Vol 36, Issue 3, p180
- ISSN
1063-4576
- Publication type
Article
- DOI
10.3103/S1063457614030058