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- Title
Aberration-Free Lateral Shear Holographic Interferometry.
- Authors
Lyalikov, A. M.
- Abstract
Lateral shear interferometry is considered as a possible means for optical correction of wave fronts reconstructed from singly and doubly exposed holograms. Optical aberrations are eliminated in a moiré pattern by superposing two lateral shear interferograms using waves diffracted by original holograms. It is shown that the singly exposed hologram allows compensation for only optical inhomogeneities due to the substrate, while the doubly exposed hologram also excludes aberrations due to the recording system. The experimental results supporting the efficiency of the method as applied to imperfect substrates of holograms are presented. © 2005 Pleiades Publishing, Inc.
- Subjects
INTERFEROMETRY; OPTICAL measurements; LASER beams; OPTICS
- Publication
Technical Physics, 2005, Vol 50, Issue 9, p1182
- ISSN
1063-7842
- Publication type
Article
- DOI
10.1134/1.2051459