We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Reduction of two-dimensional small- and wide-angle X-ray scattering data.
- Authors
Boesecke, Peter
- Abstract
At the beamlines ID01 and ID02 of the European Synchrotron Radiation Facility in Grenoble, France, position-sensitive detectors for time-resolved small- and wide-angle X-ray scattering experiments are in use. The applied data reduction method has never been described comprehensively. This article outlines the parametrization of the raw data and introduces the programs developed for this purpose. Data reduction in the sense of this article means all steps between detector readout and normalization to absolute scattering intensities. This includes all corrections that can be made without any specific knowledge of the sample, e.g. detector dark-image correction, division by a flat-field and intensity normalization. Processed data are either two- or one-dimensional. Optionally, statistical errors can be propagated through the calculations.
- Subjects
SMALL-angle X-ray scattering; DETECTORS; ENGINEERING instruments; ELECTROMAGNETIC waves; PHYSICS instruments; AUTOMATIC data collection systems
- Publication
Journal of Applied Crystallography, 2007, Vol 40, ps423
- ISSN
0021-8898
- Publication type
Article
- DOI
10.1107/S0021889807001100