Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleMeasurements of Residual Stresses in Micron Regions by Using Synchrotron Excited Kossel Diffraction.AuthorsBrechbühl, J.; Bauch, J.; Ullrich, H.-J.PublicationCrystal Research & Technology, 1999, Vol 34, Issue 1, p59ISSN0232-1300Publication typeArticleDOI10.1002/(SICI)1521-4079(199901)34:1<59::AID-CRAT59>3.0.CO;2-#