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- Title
Determination of the Parameters of Films Formed on the Liquid Subphase According to Reflectometry Data.
- Authors
Astaf'ev, S. B.; Yanusova, L. G.
- Abstract
Methods for determining the film thickness based on the processing of X-ray scattering reflectometry data are considered. The method is proposed uses the wavelet transformation of the intensity of specular scattering and does not require any special assumptions and model constructions. Thicknesses of real films calculated this way coincide with the values obtained using other known methods of determining the thickness. All the methods considered in the work are implemented in the BARD analytical software package.
- Subjects
LIQUID films; REFLECTOMETRY; X-ray reflectometry; INTEGRATED software
- Publication
Crystallography Reports, 2021, Vol 66, Issue 6, p1082
- ISSN
1063-7745
- Publication type
Article
- DOI
10.1134/S1063774521060031