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- Title
Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
- Authors
Noh, Ji Yong; Han, Dong Min; Jeong, Woo Cheol; Kim, Jong Woo; Cha, Soo Youle
- Abstract
Abstract: We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
- Subjects
ORGANIC light emitting diodes; RELIABILITY in engineering; SEMICONDUCTORS; MOTHERBOARDS; INTEGRATED circuits
- Publication
Journal of the Society for Information Display, 2018, Vol 26, Issue 1, p36
- ISSN
1071-0922
- Publication type
Article
- DOI
10.1002/jsid.628