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- Title
A NEW APPROACH TO PREPARE POLYCRYSTALLINE PbTe–TeO THIN FILM, AND ITS OPTICAL, STRUCTURAL, SURFACE AND ELECTRICAL CHARACTERIZATION.
- Authors
TEZEL, FATMA MEYDANERI; KARIPER, İ. AFŞIN
- Abstract
In this study, PbTe thin film was produced on glass substrates, via chemical bath deposition (CBD) method, with 3-h deposition time at 50∘C. The produced thin film had polycrystalline structure; TeO2, PbTe, PbTe3 and Te2O5 crystals that were characterized by X-ray diffraction (XRD) had tetragonal, cubic, tetragonal and monoclinic crystal structures, respectively. Reflectivity (R ; in %), optical transmission (T ; in %), optical bandgap ( E g) , absorption, dielectric constant (ε) , extinction coefficient (k) and refractive index ( n r) of polycrystalline PbTe thin film obtained using UV–Vis spectrophotometer were 29.87%, 19.41%, 3.30 eV, 0.6, 3.72, 0.05 and 4.08, respectively. Grain sizes of polycrystalline PbTe thin film varied between 8.79 nm and 52.55 nm. Optical and electrical conductivities of the crystals according to photon energy were calculated using optical parameters, whereas their surface morphology was characterized by scanning electron microscopy (SEM). The thickness of polycrystalline PbTe thin film was measured by atomic force microscopy (AFM), and found to be 900 nm.
- Subjects
THIN films; SURFACE analysis; POLYCRYSTALLINE semiconductors; CHEMICAL solution deposition; LIGHT transmission; ELECTRIC conductivity
- Publication
Surface Review & Letters, 2021, Vol 28, Issue 4, pN.PAG
- ISSN
0218-625X
- Publication type
Article
- DOI
10.1142/S0218625X21500190